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In order to provide high quality services SE has invested in a range of mechanical testing and characterization equipment. This equipment is used for QC and also to offer material testing services to the university and local industry.
Amongst the material characterization techniques available at SE are:
• X-Ray Diffraction
• Micro hardness testing
• Macro hardness testing
• Pin-on-disc wear testing
• Scratch testing
• Pull-off adhesion testing
• Rotary-bending fatigue testing
• Creep testing
• Tensile / Compressive testing
• Impact testing
• A vast array of microscopy imaging techniques, equipped with computer based image acquisition and analysis.
• Electrochemical testing
• Salt spray testing
To complement the extensive range of material testing facilities, SE has invested heavily and keeps on investing in the training of its personnel, which receive training locally and in institutions overseas. SE is committed to establish itself as the leading material characterization laboratory in this region. In order to accomplish this goal, SE will be investing heavily both in characterization equipment and training. This will permit SE to provide an unprecedented range of state of the art characterization technique to the University and the local industry. This site will be update from time to time as more equipment becomes commissioned, so visit our site from time to time to date about the new services available at SE.
X-Ray Diffraction
X-Ray diffraction is an established technique which is used to measure the spacing between the atomic layers (the d spacing) stacked in crystalline solids. By measuring the d spacing in different crystalline orientations, this technique can be used to determine the crystal structure and help to identify the material under investigation. The diffractometer augmented with a computer and software algorithms is capable of measuring residual stress on the surface, phase composition, impurity content in a specific phase, crystal orientation, measurement of coating thickness and phase identification.
The diffractometer which can be configured in both the θ – θ and θ – 2θ configuration, is based on the D8 Series II technology produced by Bruker. Hardware and software are optimized for easy operation and the focusing Bragg – Brentano geometry with slits provides the best resolution for flat and powder samples.
The diffractometer is equipped with a high temperature furnace which permits in situ study of thermally induced thermal transformations. Soller slits enable the analysis of thin films, 0.5μm and above, while minimizing influence of substrate.
Shortly this machine will be equipped with Göbel mirror and array detector to enable investigations on irregularly shaped samples. This upgrade will also include an extensive software package which will enhance the capabilities of this machine.
CHARACTERIZATION EQUIPMENT:
- X-Ray Diffraction (XRD)
- Metallographic Characterization (Stereo / Optical microscopes)
- Analytical Investigation
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